Testing

Level 1 - Primary Characteristic’s Of Device is verified at 25C. This may include the following:

• Device Value and Tolerance
• Device Voltage Operating Range
• Device Frequency Range

Level 2 - Secondary Characteristics or Temperature Testing (70C, 85C or 125C) is included in the testing.

Level 1 - 1 to 3 of the Devices Primary Characteristics is verified at 25C. This may include the following:

• Forward Bias Voltage
• Reverse  Bias Voltage
• Breakdown Voltage
• Threshold Voltage
• On Resistance
• Av, hfe, or Gain
• Imax current or Operating Current

Level 2 – Primary Characteristic Temperature Testing (70C, 85C or 125C) is added to the testing.
Level 3 – Test to the following Mil-Std Subgroups 1, 2, 3, and 4 (optional).  Includes testing at specified temperatures (-55C, -40C, 0C, 25C, 70C, 85C, and 125C)

Level 1 – 1 to 3 of the Devices Primary Characteristic’s Of Device is verified at 25C. This may include the following:

• Forward Bias
• Reverse  Bias
• Breakdown Voltage
• Threshold Voltage
• On Resistance
• Av, hfe, or Gain

Level 2 – Testing of Level 1 parameters at Temperature (-55C, -40C, 0C, 25C, 70C, 85C, 125C).
Level 3 - Verification of All DC parameters to Manufactures Specification at 25C.
Level 4 - Verification of All DC parameters (Group A table II) to Manufactures Specification at Temperature (-55C, -40C,0C,70C, 85C, 125C). 

Level 1 – 1 to 3 of the Devices Primary Characteristic’s Of Device is verified at 25C. This may include the following:

• VIH/VIL
• VOH/VOL at specified Load
• Shutdown or Tri-state
• Truth Table verification
• ICC (quiescent or operating)
• Min/Max Operating Voltage

Level 2 – Testing of Level 1 parameters at Temperature (-55C, -40C, 0C, 25C, 70C, 85C, 125C).
Level 3 - Verification of All DC parameters to Manufactures Specification at 25C.
Level 4 - Verification of All DC parameters (Group A table II) to Manufactures Specification at Temperature (-55C, -40C,0C,70C, 85C, 125C).

Level 1 – Pin Correlation
Level 2 – IDCODE Verification

Level 1 – Pin Correlation
Level 2 – 25C Testing using memory test equipment to verify memory functions of devices.
Level 3 - 25C and 70C (85C or 125C) Testing using memory test equipment to verify memory functions of devices.

Level 1 – Pin Correlation
Level 2 – 25C Testing of FPGA programming (Configuration and Readback) and/or IDCODE Verification.
Level 3 - 25C and 70C (85C or 125C) Testing of FPGA programming (Configuration and Readback) and/or IDCODE Verification.
Level 4 – Speed Grade verification at 70C (85C or 125C). 3 step process below:

1. Created Design using Altera or Xilinx design software.
2. Generate Timing analysis and delay calculations of design to specified speed grade.
3. Test devices against speedgrade generated test limits.